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Home »Technical Reports»Other»Traceable calibration and uncertainty of measurements in scanning electron microscopy NT TR 252

Traceable calibration and uncertainty of measurements in scanning electron microscopy NT TR 252

Posted onSeptember 6, 1994October 6, 2020Author

  • Report #: NT TR 252
  • Approved: September 1994
  • Author(s): Halldór Gudmundsson & Tómas P. Rúnarsson
  • Version: 1
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Size: 3.17 MB

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CategoriesOther, Technical ReportsTagscalibration, scanning electron microscopy, SEM, traceable calibration, uncertainty

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